In-Depth Chemical and Optoelectronic Analysis of Triple-Cation Perovskite Thin Films by Combining XPS Profiling and PL Imaging.

Cacovich, Stefania; Dally, Pia; Vidon, Guillaume; Legrand, Marie; Gbegnon, Stéphanie; Rousset, Jean; Puel, Jean-Baptiste; Guillemoles, Jean-François; Schulz, Philip; Bouttemy, Muriel; Etcheberry, Arnaud.

Afiliação

Cacovich S; CNRS, Institut Photovoltaïque d'Île de France (IPVF), UMR 9006, 18 boulevard Thomas Gobert, 91120 Palaiseau, France.
Dally P; Institut Photovoltaïque d'Île de France (IPVF), 18 boulevard Thomas Gobert, 91120 Palaiseau, France.
Vidon G; Institut Lavoisier de Versailles (ILV), Université de Versailles Saint-Quentin-en-Yvelines, Université Paris-Saclay, CNRS, UMR 8180, 45 avenue des Etats-Unis, 78035 Versailles CEDEX, France.
Legrand M; Institut Photovoltaïque d'Île de France (IPVF), 18 boulevard Thomas Gobert, 91120 Palaiseau, France.
Gbegnon S; Institut Photovoltaïque d'Île de France (IPVF), 18 boulevard Thomas Gobert, 91120 Palaiseau, France.
Rousset J; EDF R&D, Institut Photovoltaïque d'Île de France (IPVF), 18 boulevard Thomas Gobert, 91120 Palaiseau, France.
Puel JB; Institut Photovoltaïque d'Île de France (IPVF), 18 boulevard Thomas Gobert, 91120 Palaiseau, France.
Guillemoles JF; Institut Photovoltaïque d'Île de France (IPVF), 18 boulevard Thomas Gobert, 91120 Palaiseau, France.
Schulz P; EDF R&D, Institut Photovoltaïque d'Île de France (IPVF), 18 boulevard Thomas Gobert, 91120 Palaiseau, France.
Bouttemy M; Institut Photovoltaïque d'Île de France (IPVF), 18 boulevard Thomas Gobert, 91120 Palaiseau, France.
Etcheberry A; EDF R&D, Institut Photovoltaïque d'Île de France (IPVF), 18 boulevard Thomas Gobert, 91120 Palaiseau, France.

ACS Appl Mater Interfaces ; 14(30): 34228-34237, 2022 Aug 03.

Article em En | MEDLINE | ID: mdl-35245028

Palavras-chave

X-ray photoelectron spectroscopy; film thinning by Ar+ ion beam sputtering; halide perovskites; in-depth chemical analysis; photoluminescence; profiling

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2022 Tipo de documento: Article

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2022 Tipo de documento: Article