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High Sensitivity SERS Substrate of a Few Nanometers Single-Layer Silver Thickness Fabricated by DC Magnetron Sputtering Technology.
Wu, Hsing-Yu; Lin, Hung-Chun; Hung, Guan-Yi; Tu, Chi-Shun; Liu, Ting-Yu; Hong, Chung-Hung; Yu, Guoyu; Hsu, Jin-Cherng.
Afiliação
  • Wu HY; System Manufacturing Center, National Chung-Shan Institute of Science and Technology, New Taipei City 237209, Taiwan.
  • Lin HC; Center for Astronomical Physics and Engineering, Department of Optics and Photonics, National Central University, Taoyuan City 320317, Taiwan.
  • Hung GY; Department of Physics, Fu Jen Catholic University, New Taipei City 242062, Taiwan.
  • Tu CS; Department of International Ph.D. Program in Innovative Technology of Biomedical Engineering and Medical Devices, Ming Chi University of Technology, New Taipei City 243303, Taiwan.
  • Liu TY; Department of Physics, Fu Jen Catholic University, New Taipei City 242062, Taiwan.
  • Hong CH; Department of Materials Engineering, Ming Chi University of Technology, New Taipei City 243303, Taiwan.
  • Yu G; Kidney Research Center, Department of Nephrology, Chang Gung Memorial Hospital, College of Medicine, Chang Gung University, 5 Fu-Shing St., Taoyuan 33333, Taiwan.
  • Hsu JC; Department of Engineering and Technology, School of Computing and Engineering, University of Huddersfield, Queensgate, Huddersfield HD1 3DH, UK.
Nanomaterials (Basel) ; 12(16)2022 Aug 10.
Article em En | MEDLINE | ID: mdl-36014606
ABSTRACT
Surface-enhanced Raman spectroscopy (SERS) is commonly used for super-selective analysis through nanostructured silver layers in the environment, food quality, biomedicine, and materials science. To fabricate a high-sensitivity but a more accessible device of SERS, DC magnetron sputtering technology was used to realize high sensitivity, low cost, a stable deposition rate, and rapid mass production. This study investigated various thicknesses of a silver film ranging from 3.0 to 12.1 nm by field emission scanning electron microscope, X-ray diffraction, and X-ray photoelectron spectroscopy. In the rhodamine 6G (R6G) testing irradiated by a He-Ne laser beam, the analytical enhancement factor (AEF) of 9.35 × 108, the limit of detection (LOD) of 10-8 M, and the relative standard deviation (RSD) of 1.61% were better than the other SERS substrates fabricated by the same DC sputtering process because the results showed that the 6 nm thickness silver layer had the highest sensitivity, stability, and lifetime. The paraquat and acetylcholine analytes were further investigated and high sensitivity was also achievable. The proposed SERS samples were evaluated and stored in a low humidity environment for up to forty weeks, and no spectrum attenuation could be detected. Soon, the proposed technology to fabricate high sensitivity, repeatability, and robust SERS substrate will be an optimized process technology in multiple applications.
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Texto completo: 1 Base de dados: MEDLINE Tipo de estudo: Diagnostic_studies Idioma: En Ano de publicação: 2022 Tipo de documento: Article

Texto completo: 1 Base de dados: MEDLINE Tipo de estudo: Diagnostic_studies Idioma: En Ano de publicação: 2022 Tipo de documento: Article