Nanoscale characterization of the heterogeneous interfacial oxidation layer of graphene/Cu based on a SEM electron beam induced reduction effect.

Feng, Panpan; Zhang, Dan; Zhang, Peng; Wang, You; Gan, Yang.

Afiliação

Feng P; School of Chemistry and Chemical Engineering, Harbin Institute of Technology, Harbin 150001, P. R. China. ygan@hit.edu.cn.
Zhang D; MIIT Key Laboratory of Critical Materials Technology for New Energy Conversion and Storage, School of Chemistry and Chemical Engineering, Harbin Institute of Technology, Harbin 150001, P. R. China.
Zhang P; School of Chemistry and Chemical Engineering, Harbin Institute of Technology, Harbin 150001, P. R. China. ygan@hit.edu.cn.
Wang Y; MIIT Key Laboratory of Critical Materials Technology for New Energy Conversion and Storage, School of Chemistry and Chemical Engineering, Harbin Institute of Technology, Harbin 150001, P. R. China.
Gan Y; Manufacturing Engineering for Aviation and Aerospace, School of Mechatronics Engineering, Harbin Institute of Technology, Harbin 150001, P. R. China.

Phys Chem Chem Phys ; 25(12): 8816-8825, 2023 Mar 22.

Article em En | MEDLINE | ID: mdl-36916298

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2023 Tipo de documento: Article

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2023 Tipo de documento: Article