Regulating the Electrical and Mechanical Properties of TaS<sub>2</sub> Films via van der Waals and Electrostatic Interaction for High Performance Electromagnetic Interference Shielding.

Deng, Fukang; Wei, Jianhong; Xu, Yadong; Lin, Zhiqiang; Lu, Xi; Wan, Yan-Jun; Sun, Rong; Wong, Ching-Ping; Hu, Yougen

Regulating the Electrical and Mechanical Properties of TaS₂ Films via van der Waals and Electrostatic Interaction for High Performance Electromagnetic Interference Shielding.

Deng, Fukang; Wei, Jianhong; Xu, Yadong; Lin, Zhiqiang; Lu, Xi; Wan, Yan-Jun; Sun, Rong; Wong, Ching-Ping; Hu, Yougen.

Afiliação

Deng F; Shenzhen Institute of Advanced Electronic Materials, Shenzhen Institute of Advanced Technology, Chinese Academy of Sciences, Shenzhen, 518055, People's Republic of China.
Wei J; Shenzhen Institute of Advanced Electronic Materials, Shenzhen Institute of Advanced Technology, Chinese Academy of Sciences, Shenzhen, 518055, People's Republic of China.
Xu Y; Shenzhen Geim Graphene Center, Institute of Materials Research, Shenzhen International Graduate School, Tsinghua University, Shenzhen, 518055, People's Republic of China.
Lin Z; Shenzhen Institute of Advanced Electronic Materials, Shenzhen Institute of Advanced Technology, Chinese Academy of Sciences, Shenzhen, 518055, People's Republic of China.
Lu X; Shenzhen Institute of Advanced Electronic Materials, Shenzhen Institute of Advanced Technology, Chinese Academy of Sciences, Shenzhen, 518055, People's Republic of China.
Wan YJ; Shenzhen Institute of Advanced Electronic Materials, Shenzhen Institute of Advanced Technology, Chinese Academy of Sciences, Shenzhen, 518055, People's Republic of China.
Sun R; Shenzhen Institute of Advanced Electronic Materials, Shenzhen Institute of Advanced Technology, Chinese Academy of Sciences, Shenzhen, 518055, People's Republic of China.
Wong CP; Shenzhen Institute of Advanced Electronic Materials, Shenzhen Institute of Advanced Technology, Chinese Academy of Sciences, Shenzhen, 518055, People's Republic of China. rong.sun@siat.ac.cn.
Hu Y; School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, GA, 30332, USA.