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Titanium oxide nanomaterials as an electron-selective contact in silicon solar cells for photovoltaic devices.
Kang, Dongkyun; Ko, Jongwon; Lee, Changhyun; Kim, Donghwan; Lee, Hyunju; Kang, Yoonmook; Lee, Hae-Seok.
Afiliação
  • Kang D; Department of Materials Science and Engineering, Korea University, Seoul, 0284, Korea.
  • Ko J; Department of Materials Science and Engineering, Korea University, Seoul, 0284, Korea.
  • Lee C; Department of Materials Science and Engineering, Korea University, Seoul, 0284, Korea.
  • Kim D; Department of Materials Science and Engineering, Korea University, Seoul, 0284, Korea.
  • Lee H; Meiji Renewable Energy Laboratory, Meiji University, 1-1-1 Higashimita, Tama-Ku, Kawasaki, 214-8571, Japan.
  • Kang Y; KU-KIST Green School, Graduate School of Energy Environment, Korea University, Seoul, Korea. ddang@korea.ac.kr.
  • Lee HS; KU-KIST Green School, Graduate School of Energy Environment, Korea University, Seoul, Korea. lhseok@korea.ac.kr.
Discov Nano ; 18(1): 39, 2023 Mar 11.
Article em En | MEDLINE | ID: mdl-37382848
ABSTRACT
To obtain high conversion efficiency, various carrier-selective contact structures are being applied to the silicon solar cell, and many related studies are being conducted. We conducted research on TiO2 to create an electron-selective contact structure that does not require a high-temperature process. Titanium metal was deposited using a thermal evaporator, and an additional oxidation process was conducted to form titanium oxide. The chemical compositions and phases of the titanium dioxide layers were analyzed by X-ray diffraction. The passivation effects of each titanium oxide layer were measured using the quasi-steady-state photoconductance. In this study, the layer properties were analyzed when TiO2 had a passivation effect on the silicon surface. The charge and interface defect densities of the layer were analyzed through CV measurements, and the passivation characteristics according to the TiO2 phase change were investigated. As a result, by applying optimized TiO2 layer thickness and annealing temperature conditions through the experiment for passivation to the cell-like structure, which is the structure before metal and electrode formation, an implied open-circuit voltage (iVoc) of 630 mV and an emitter saturation current density (J0) value of 60.4 fA/cm2 were confirmed.
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Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2023 Tipo de documento: Article

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2023 Tipo de documento: Article