Online dynamic flat-field correction for MHz microscopy data at European XFEL.

Birnsteinova, Sarlota; Ferreira de Lima, Danilo E; Sobolev, Egor; Kirkwood, Henry J; Bellucci, Valerio; Bean, Richard J; Kim, Chan; Koliyadu, Jayanath C P; Sato, Tokushi; Dall'Antonia, Fabio; Asimakopoulou, Eleni Myrto; Yao, Zisheng; Buakor, Khachiwan; Zhang, Yuhe; Meents, Alke; Chapman, Henry N; Mancuso, Adrian P; Villanueva-Perez, Pablo; Vagovic, Patrik.

Afiliação

Birnsteinova S; European XFEL GmbH, Schenefeld, Germany.
Ferreira de Lima DE; European XFEL GmbH, Schenefeld, Germany.
Sobolev E; European XFEL GmbH, Schenefeld, Germany.
Kirkwood HJ; European XFEL GmbH, Schenefeld, Germany.
Bellucci V; European XFEL GmbH, Schenefeld, Germany.
Bean RJ; European XFEL GmbH, Schenefeld, Germany.
Kim C; European XFEL GmbH, Schenefeld, Germany.
Koliyadu JCP; European XFEL GmbH, Schenefeld, Germany.
Sato T; European XFEL GmbH, Schenefeld, Germany.
Dall'Antonia F; European XFEL GmbH, Schenefeld, Germany.
Asimakopoulou EM; Synchrotron Radiation Research and NanoLund, Lund University, Lund, Sweden.
Yao Z; Synchrotron Radiation Research and NanoLund, Lund University, Lund, Sweden.
Buakor K; European XFEL GmbH, Schenefeld, Germany.
Zhang Y; Synchrotron Radiation Research and NanoLund, Lund University, Lund, Sweden.
Meents A; Center for Free-Electron Laser Science (CFEL), DESY, Hamburg, Germany.
Chapman HN; Center for Free-Electron Laser Science (CFEL), DESY, Hamburg, Germany.
Mancuso AP; European XFEL GmbH, Schenefeld, Germany.
Villanueva-Perez P; Synchrotron Radiation Research and NanoLund, Lund University, Lund, Sweden.
Vagovic P; European XFEL GmbH, Schenefeld, Germany.