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Anti-friction gold-based stretchable electronics enabled by interfacial diffusion-induced cohesion.
Cao, Jie; Liu, Xusheng; Qiu, Jie; Yue, Zhifei; Li, Yang; Xu, Qian; Chen, Yan; Chen, Jiewen; Cheng, Hongfei; Xing, Guozhong; Song, Enming; Wang, Ming; Liu, Qi; Liu, Ming.
Afiliação
  • Cao J; Frontier Institute of Chip and System, State Key Laboratory of Integrated Chips and Systems, Zhangjiang Fudan International Innovation Center, Fudan University, Shanghai, 200433, China.
  • Liu X; Frontier Institute of Chip and System, State Key Laboratory of Integrated Chips and Systems, Zhangjiang Fudan International Innovation Center, Fudan University, Shanghai, 200433, China.
  • Qiu J; School of Microelectronics, Fudan University, Shanghai, 200433, China.
  • Yue Z; Frontier Institute of Chip and System, State Key Laboratory of Integrated Chips and Systems, Zhangjiang Fudan International Innovation Center, Fudan University, Shanghai, 200433, China.
  • Li Y; Frontier Institute of Chip and System, State Key Laboratory of Integrated Chips and Systems, Zhangjiang Fudan International Innovation Center, Fudan University, Shanghai, 200433, China.
  • Xu Q; Frontier Institute of Chip and System, State Key Laboratory of Integrated Chips and Systems, Zhangjiang Fudan International Innovation Center, Fudan University, Shanghai, 200433, China.
  • Chen Y; Frontier Institute of Chip and System, State Key Laboratory of Integrated Chips and Systems, Zhangjiang Fudan International Innovation Center, Fudan University, Shanghai, 200433, China.
  • Chen J; School of Microelectronics, Fudan University, Shanghai, 200433, China.
  • Cheng H; Frontier Institute of Chip and System, State Key Laboratory of Integrated Chips and Systems, Zhangjiang Fudan International Innovation Center, Fudan University, Shanghai, 200433, China.
  • Xing G; School of Microelectronics, Fudan University, Shanghai, 200433, China.
  • Song E; Frontier Institute of Chip and System, State Key Laboratory of Integrated Chips and Systems, Zhangjiang Fudan International Innovation Center, Fudan University, Shanghai, 200433, China.
  • Wang M; School of Materials Science and Engineering, Tongji University, Shanghai, 201804, China.
  • Liu Q; Key Laboratory of Microelectronic Devices & Integrated Technology, Institute of Microelectronics, University of the Chinese Academy of Sciences, Chinese Academy of Sciences, Beijing, 100029, China.
  • Liu M; Shanghai Frontiers Science Research Base of Intelligent Optoelectronics and Perception, Institute of Optoelectronics, State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, 200433, China.
Nat Commun ; 15(1): 1116, 2024 Feb 06.
Article em En | MEDLINE | ID: mdl-38321072
ABSTRACT
Stretchable electronics that prevalently adopt chemically inert metals as sensing layers and interconnect wires have enabled high-fidelity signal acquisition for on-skin applications. However, the weak interfacial interaction between inert metals and elastomers limit the tolerance of the device to external friction interferences. Here, we report an interfacial diffusion-induced cohesion strategy that utilizes hydrophilic polyurethane to wet gold (Au) grains and render them wrapped by strong hydrogen bonding, resulting in a high interfacial binding strength of 1017.6 N/m. By further constructing a nanoscale rough configuration of the polyurethane (RPU), the binding strength of Au-RPU device increases to 1243.4 N/m, which is 100 and 4 times higher than that of conventional polydimethylsiloxane and styrene-ethylene-butylene-styrene-based devices, respectively. The stretchable Au-RPU device can remain good electrical conductivity after 1022 frictions at 130 kPa pressure, and reliably record high-fidelity electrophysiological signals. Furthermore, an anti-friction pressure sensor array is constructed based on Au-RPU interconnect wires, demonstrating a superior mechanical durability for concentrated large pressure acquisition. This chemical modification-free approach of interfacial strengthening for chemically inert metal-based stretchable electronics is promising for three-dimensional integration and on-chip interconnection.

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2024 Tipo de documento: Article

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2024 Tipo de documento: Article