Detalhe da pesquisa
1.
Investigation of the Capacitance-Voltage Electrical Characteristics of Thin-Film Transistors Caused by Hydrogen Diffusion under Negative Bias Stress in a Moist Environment.
ACS Appl Mater Interfaces
; 11(43): 40196-40203, 2019 Oct 30.
Artigo
em Inglês
| MEDLINE | ID: mdl-31573173
2.
Cyclical Annealing Technique To Enhance Reliability of Amorphous Metal Oxide Thin Film Transistors.
ACS Appl Mater Interfaces
; 10(31): 25866-25870, 2018 Aug 08.
Artigo
em Inglês
| MEDLINE | ID: mdl-29481039