Artifacts reduction in high-acutance phase images for X-ray grating interferometry.

X-ray grating-based techniques often lead to artifacts in the phase retrieval process of phase objects presenting very fast spatial transitions or sudden jumps, especially in the field of non-destructive testing and evaluation. In this paper, we present a method that prevents the emergence of artifacts by building an interferogram corrected from any variations of the object intensity and given as input in the phase retrieval process. For illustration, this method is applied to a carbon fiber specimen imaged by a microfocus X-ray tube and a single 2D grating. A significant reduction of artifacts has been obtained, by a factor higher than 10. This evaluation has been performed experimentally thanks to the Confidence Map tool, a recently developed method that estimates the error distribution from the phase gradient information.

Confidence map tool for gradient-based X-ray phase contrast imaging.

We present a graphical tool that we call a "confidence map". It allows to evaluate locally the quality of a phase image retrieved from the measurement of its gradients. The tool is primarily used to alert the observer to the presence of artifacts that could affect his interpretation of the image. It can also be used to optimize a phase imager since it associates a cause with the creation of each artifact: dislocation, under-sampling and noise. An illustration of the use of the confidence map tool is presented, based on a microfocus X-ray tube using multilateral shearing interferometry, a gradient based phase contrast technique employing a single 2D-grating.

Extracting more than two orthogonal derivatives from a Shack-Hartmann wavefront sensor.

The purpose of this paper is to show that the Shack-Hartmann wavefront sensor (SHWFS) gives access to more derivatives than the two orthogonal derivatives classically extracted either by estimating the centroid or by taking into account the first two harmonics of the Fourier transform. The demonstration is based on a simple model of the SHWFS, taking into account the microlens array as a whole and linking the SHWFS to the multi-lateral shearing interferometry family. This allows for estimating the quality of these additional derivatives, paving the way to new reconstruction techniques involving more than two cross derivatives that should improve the signal-to-noise ratio.