Detalhe da pesquisa
1.
PINK: a tender X-ray beamline for X-ray emission spectroscopy.
J Synchrotron Radiat
; 31(Pt 3): 622-634, 2024 May 01.
Artigo
em Inglês
| MEDLINE | ID: mdl-38662410
2.
At-wavelength inspection of sub-40 nm defects in extreme ultraviolet lithography mask blank by photoemission electron microscopy.
Opt Lett
; 32(13): 1875-7, 2007 Jul 01.
Artigo
em Inglês
| MEDLINE | ID: mdl-17603599