Characterization of the Uniformity of High-Flux CdZnTe Material.

Since the late 2000s, the availability of high-quality cadmium zinc telluride (CdZnTe) has greatly increased. The excellent spectroscopic performance of this material has enabled the development of detectors with volumes exceeding 1 cm3 for use in the detection of nuclear materials. CdZnTe is also of great interest to the photon science community for applications in X-ray imaging cameras at synchrotron light sources and free electron lasers. Historically, spatial variations in the crystal properties and temporal instabilities under high-intensity irradiation has limited the use of CdZnTe detectors in these applications. Recently, Redlen Technologies have developed high-flux-capable CdZnTe material (HF-CdZnTe), which promises improved spatial and temporal stability. In this paper, the results of the characterization of 10 HF-CdZnTe detectors with dimensions of 20.35 mm × 20.45 mm × 2.00 mm are presented. Each sensor has 80 × 80 pixels on a 250-m pitch and were flip-chip-bonded to the STFC HEXITEC ASIC. These devices show excellent spectroscopic performance at room temperature, with an average Full Width at Half Maximum (FWHM) of 0.83 keV measured at 59.54 keV. The effect of tellurium inclusions in these devices was found to be negligible; however, some detectors did show significant concentrations of scratches and dislocation walls. An investigation of the detector stability over 12 h of continuous operation showed negligible changes in performance.

Energy-resolved electron-yield XAS studies of nanoporous CoAlPO-18 and CoAlPO-34 catalysts.

Energy-resolved electron-yield X-ray absorption spectroscopy is a promising technique for probing the near-surface structure of nanomaterials because of its ability to discriminate between the near-surface and bulk of materials. So far, the technique has only been used in model systems. Here, the local structural characterization of nanoporous cobalt-substituted aluminophosphates is reported and it is shown that the technique can be employed for the study of open-framework catalytically active systems. Evidence that the cobalt ions on the surface of the crystals react differently to those in the bulk is found.

Application of gas microstrip detectors for X-ray absorption spectroscopy in common process gases.

We report upon the design of a new gas microstrip detector (GMSD) for use in X-ray absorption spectroscopy applied to the study of catalysis and material science. We show that GMSDs can operate not only with the gas mixtures normally used in proportional counters but also with the majority of gas mixtures used in common catalytic reactions. The detector functions well in the presence of water vapor. EXAFS investigations of a test system of NiO on Ni metal are discussed in which it is demonstrated that depth profiling using electron yield X-ray absorption spectroscopy is possible in a wide variety of gaseous environments. Electron detection of XAS using GMSDs is applicable to metals, semiconductors, and insulators presented in almost all forms of sample including films, pellets, powders, crystals, and liquids.