RESUMO
The capacity to synthesize and design highly intricated nanoscale objects of different sizes, surfaces, and shapes dramatically conditions the development of multifunctional nanomaterials. Ultrafast laser technology holds great promise as a contactless process able to rationally and rapidly manufacture complex nanostructures bringing innovative surface functions. The most critical challenge in controlling the growth of laser-induced structures below the light diffraction limit is the absence of external order associated to the inherent local interaction due to the self-organizing nature of the phenomenon. Here high aspect-ratio nanopatterns driven by near-field surface coupling and architectured by timely-controlled polarization pulse shaping are reported. Electromagnetic coupled with hydrodynamic simulations reveal why this unique optical manipulation allows peaks generation by inhomogeneous local absorption sustained by nanoscale convection. The obtained high aspect-ratio surface nanotopography is expected to prevent bacterial proliferation, and have great potential for catalysis, vacuum to deep UV photonics and sensing.
Assuntos
Nanoestruturas , Catálise , Lasers , Luz , Nanoestruturas/química , Óptica e FotônicaRESUMO
A laser-irradiated surface is the paradigm of a self-organizing system, as coherent, aligned, chaotic, and complex patterns emerge at the microscale and even the nanoscale. A spectacular manifestation of dissipative structures consists of different types of randomly and periodically distributed nanostructures that arise from a homogeneous metal surface. The noninstantaneous response of the material reorganizes local surface topography down to tens of nanometers scale modifying long-range surface morphology on the impact scale. Under ultrafast laser irradiation with a regulated energy dose, the formation of nanopeaks, nanobumps, nanohumps and nanocavities patterns with 20-80 nm transverse size unit and up to 100 nm height are reported. We show that the use of crossed-polarized double laser pulse adds an extra dimension to the nanostructuring process as laser energy dose and multi-pulse feedback tune the energy gradient distribution, crossing critical values for surface self-organization regimes. The tiny dimensions of complex patterns are defined by the competition between the evolution of transient liquid structures generated in a cavitation process and the rapid resolidification of the surface region. Strongly influencing the light coupling, we reveal that initial surface roughness and type of roughness both play a crucial role in controlling the transient emergence of nanostructures during laser irradiation.
RESUMO
The structural changes generated in surface regions of single crystal Ni targets by femtosecond laser irradiation are investigated experimentally and computationally for laser fluences that, in the multipulse irradiation regime, produce sub-100 nm high spatial frequency surface structures. Detailed experimental characterization of the irradiated targets combining electron back scattered diffraction analysis with high-resolution transmission electron microscopy reveals the presence of multiple nanoscale twinned domains in the irradiated surface regions of single crystal targets with (111) surface orientation. Atomistic- and continuum-level simulations performed for experimental irradiation conditions reproduce the generation of twinned domains and establish the conditions leading to the formation of growth twin boundaries in the course of the fast transient melting and epitaxial regrowth of the surface regions of the irradiated targets. The observation of growth twins in the irradiated Ni(111) targets provides strong evidence of the role of surface melting and resolidification in the formation of high spatial frequency surface structures. This also suggests that the formation of twinned domains can be used as a sensitive measure of the levels of liquid undercooling achieved in short pulse laser processing of metals.
RESUMO
The moving screen technique for pattern centre localisation is revisited. A cross-correlation based iterative procedure is developed to find both the zoom factor and the zoom centre (which is also the pattern centre) between two EBSD diffraction patterns acquired at two camera positions. The procedure involves two steps: first, a rough estimate of the pattern centre position and zoom factor (the ratio of the two detector distances) is obtained by cross-correlating the entire images. Then, based on this first estimate, cross-correlation of smaller regions of interest (ROIs) gives the displacement field which is interpreted as a zoom factor misfit coupled with a zoom centre position misfit. These misfits are iteratively decreased until the displacement field is reduced to the noise level. The procedure is first applied to simulated patterns and it is shown that the iterative procedure converges very rapidly to the exact solution with an accuracy better than 1/100th of pixel. The potential of this technique for experimental patterns is discussed and recommendations for new EBSD detectors are proposed.
Assuntos
Algoritmos , Microscopia Eletrônica de Varredura/métodos , Interpretação de Imagem Radiográfica Assistida por Computador/métodos , Calibragem , Cristalografia , Aumento da Imagem/métodos , Rotação , Estatística como AssuntoRESUMO
For precise orientation and strain measurements, advanced Electron Backscatter Diffraction (EBSD) techniques require both accurate calibration and reproducible measurement of the system geometry. In many cases the pattern centre (PC) needs to be determined to sub-pixel accuracy. The mechanical insertion/retraction, through the Scanning Electron Microscope (SEM) chamber wall, of the electron sensitive part of modern EBSD detectors also causes alignment and positioning problems and requires frequent monitoring of the PC. Optical alignment and lens distortion issues within the scintillator, lens and charge-coupled device (CCD) camera combination of an EBSD detector need accurate measurement for each individual EBSD system. This paper highlights and quantifies these issues and demonstrates the determination of the pattern centre using a novel shadow-casting technique with a precision of â¼10µm or â¼1/3 CCD pixel.
RESUMO
This comment on the paper "Bragg's Law diffraction simulations for electron backscatter diffraction analysis" by Kacher et al. explains the limitations in determining elastic strains using synthetic EBSD patterns. Of particular importance are those due to the accuracy of determination of the EBSD geometry projection parameters. Additional references and supporting information are provided.