Time-resolved investigation of nanometer scale deformations induced by a high flux x-ray beam.
Opt Express
; 19(16): 15516-24, 2011 Aug 01.
Article
em En
| MEDLINE
| ID: mdl-21934914
ABSTRACT
We present results of a time-resolved pump-probe experiment where a Si sample was exposed to an intense 15 keV beam and its surface monitored by measuring the wavefront deformation of a reflected optical laser probe beam. By reconstructing and back propagating the wavefront, the deformed surface can be retrieved for each time step. The dynamics of the heat bump, build-up and relaxation, is followed with a spatial resolution in the nanometer range. The results are interpreted taking into account results of finite element method simulations. Due to its robustness and simplicity this method should find further developments at new x-ray light sources (FEL) or be used to gain understanding on thermo-dynamical behavior of highly excited materials.
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1
Coleções:
01-internacional
Base de dados:
MEDLINE
Assunto principal:
Nanotecnologia
Tipo de estudo:
Risk_factors_studies
Idioma:
En
Ano de publicação:
2011
Tipo de documento:
Article