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Measurement of carrier envelope offset frequency for a 10 GHz etalon-stabilized semiconductor optical frequency comb.
Akbulut, M; Davila-Rodriguez, J; Ozdur, I; Quinlan, F; Ozharar, S; Hoghooghi, N; Delfyett, P J.
Afiliação
  • Akbulut M; CREOL: The College of Optics and Photonics, University of Central Florida, Orlando, FL 32816 USA.
Opt Express ; 19(18): 16851-65, 2011 Aug 29.
Article em En | MEDLINE | ID: mdl-21935046
ABSTRACT
We report Carrier Envelope Offset (CEO) frequency measurements of a 10 GHz harmonically mode-locked, Fabry-Perot etalon-stabilized, semiconductor optical frequency comb source. A modified multi-heterodyne mixing technique with a reference frequency comb was utilized for the measurement. Also, preliminary results from an attempt at f-2f self-referencing measurement are presented. The CEO frequency was found to be ~1.47 GHz for the particular etalon that was used.

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2011 Tipo de documento: Article

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2011 Tipo de documento: Article