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High-precision x-ray polarimetry.
Marx, B; Schulze, K S; Uschmann, I; Kämpfer, T; Lötzsch, R; Wehrhan, O; Wagner, W; Detlefs, C; Roth, T; Härtwig, J; Förster, E; Stöhlker, T; Paulus, G G.
Afiliação
  • Marx B; Institut für Optik und Quantenelektronik, Friedrich-Schiller-Universität Jena, Max-Wien-Platz 1, D-07743 Jena, Germany. berit.marx@uni-jena.de
Phys Rev Lett ; 110(25): 254801, 2013 Jun 21.
Article em En | MEDLINE | ID: mdl-23829740
ABSTRACT
The polarization purity of 6.457- and 12.914-keV x rays has been improved to the level of 2.4×10(-10) and 5.7×10(-10). The polarizers are channel-cut silicon crystals using six 90° reflections. Their performance and possible applications are demonstrated in the measurement of the optical activity of a sucrose solution.
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Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2013 Tipo de documento: Article
Buscar no Google
Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2013 Tipo de documento: Article