Dual-wavelength digital holography: single-shot shape evaluation using speckle displacements and regularization.

ABSTRACT

This paper discusses the possibility of evaluating the shape of a free-form object in comparison with its shape prescribed by a CAD model. Measurements are made based on a single-shot recording using dual-wavelength holography with a synthetic wavelength of 1.4 mm. Each hologram is numerically propagated to different focus planes and correlated. The result is a vector field of speckle displacements that is linearly dependent on the local distance between the measured surface and the focus plane. From these speckle displacements, a gradient field of the measured surface is extracted through a proportional relationship. The gradient field obtained from the measurement is then aligned to the shape of the CAD model using the iterative closest point (ICP) algorithm and regularization. Deviations between the measured shape and the CAD model are found from the phase difference field, giving a high precision shape evaluation. The phase differences and the CAD model are also used to find a representation of the measured shape. The standard deviation of the measured shape relative the CAD model varies between 7 and 19 µm, depending on the slope.