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Comparative study of the X-ray reflectivity and in-depth profile of a-C, B4C and Ni coatings at 0.1-2 keV.
Kozhevnikov, I V; Filatova, E O; Sokolov, A A; Konashuk, A S; Siewert, F; Störmer, M; Gaudin, J; Keitel, B; Samoylova, L; Sinn, H.
Afiliação
  • Kozhevnikov IV; Shubnikov Institute of Crystallography, Russian Academy of Sciences, Leninsky Prospect 59, Moscow 119333, Russian Federation.
  • Filatova EO; St Petersburg State University, Ulyanovskaya 3, Peterhof, St Petersburg 198504, Russian Federation.
  • Sokolov AA; St Petersburg State University, Ulyanovskaya 3, Peterhof, St Petersburg 198504, Russian Federation.
  • Konashuk AS; St Petersburg State University, Ulyanovskaya 3, Peterhof, St Petersburg 198504, Russian Federation.
  • Siewert F; Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Albert Einstein Strasse 15, 12489 Berlin, Germany.
  • Störmer M; Helmholtz-Zentrum Geesthacht, Institute of Materials Research, Max-Planck-Strasse 1, 21502 Geesthacht, Germany.
  • Gaudin J; Université Bordeaux 1, CEA, CNRS, CELIA, 351 Cours de la Libération, 33405 Talence, France.
  • Keitel B; DESY, Notkestrasse 85, 22607 Hamburg, Germany.
  • Samoylova L; European XFEL GmbH, Albert Einstein Ring 19, 22761 Hamburg, Germany.
  • Sinn H; European XFEL GmbH, Albert Einstein Ring 19, 22761 Hamburg, Germany.
J Synchrotron Radiat ; 22(2): 348-53, 2015 Mar.
Article em En | MEDLINE | ID: mdl-25723936
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2015 Tipo de documento: Article
Texto completo
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2015 Tipo de documento: Article