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Bayesian Inference of Nanoparticle-Broadened X-Ray Line Profiles.
Armstrong, Nicholas; Kalceff, Walter; Cline, James P; Bonevich, John E.
Afiliação
  • Armstrong N; University of Technology Sydney, PO Box 123, Broadway NSW 2007, Australia.
  • Kalceff W; University of Technology Sydney, PO Box 123, Broadway NSW 2007, Australia.
  • Cline JP; National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.
  • Bonevich JE; National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.
J Res Natl Inst Stand Technol ; 109(1): 155-178, 2004.
Article em En | MEDLINE | ID: mdl-27366604
ABSTRACT
A single-step, self-contained method for determining the crystallite-size distribution and shape from experimental x-ray line profile data is presented. It is shown that the crystallite-size distribution can be determined without invoking a functional form for the size distribution, determining instead the size distribution with the least assumptions by applying the Bayesian/MaxEnt method. The Bayesian/MaxEnt method is tested using both simulated and experimental CeO2 data, the results comparing favourably with experimental CeO2 data from TEM measurements.
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2004 Tipo de documento: Article

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2004 Tipo de documento: Article