Characterization of Amorphous Oxide Nano-Thick Layers on 316L Stainless Steel by Electron Channeling Contrast Imaging and Electron Backscatter Diffraction.

Dorri, Mahrokh; Turgeon, Stéphane; Brodusch, Nicolas; Cloutier, Maxime; Chevallier, Pascale; Gauvin, Raynald; Mantovani, Diego

Dorri, Mahrokh; Turgeon, Stéphane; Brodusch, Nicolas; Cloutier, Maxime; Chevallier, Pascale; Gauvin, Raynald; Mantovani, Diego.

Afiliação

Dorri M; 1Laboratory for Biomaterials and Bioengineering,CRC-I,Department of Mining, Metallurgical and Materials Engineering,CHU de Québec Research Center,Laval University,Pavillon Pouliot,1065 Medicine Street,Québec,QC,Canada,G1V 0A6.
Turgeon S; 2CHU Research Center of Quebec,10 rue de l'Espinay,Room E0-165,Québec,QC,Canada,G1L 3L5.
Brodusch N; 3Mining and Materials Department,McGill University,Wong Building,3610 University Street,Montréal,QC,Canada,H3A 0C5.
Cloutier M; 1Laboratory for Biomaterials and Bioengineering,CRC-I,Department of Mining, Metallurgical and Materials Engineering,CHU de Québec Research Center,Laval University,Pavillon Pouliot,1065 Medicine Street,Québec,QC,Canada,G1V 0A6.
Chevallier P; 2CHU Research Center of Quebec,10 rue de l'Espinay,Room E0-165,Québec,QC,Canada,G1L 3L5.
Gauvin R; 3Mining and Materials Department,McGill University,Wong Building,3610 University Street,Montréal,QC,Canada,H3A 0C5.
Mantovani D; 1Laboratory for Biomaterials and Bioengineering,CRC-I,Department of Mining, Metallurgical and Materials Engineering,CHU de Québec Research Center,Laval University,Pavillon Pouliot,1065 Medicine Street,Québec,QC,Canada,G1V 0A6.

Microsc Microanal ; 22(5): 997-1006, 2016 10.

Article em En | MEDLINE | ID: mdl-27681083

ABSTRACT

ABSTRACT

Characterization of the topmost surface of biomaterials is crucial to understanding their properties and interactions with the local environment. In this study, the oxide layer microstructure of plasma-modified 316L stainless steel (SS316L) samples was analyzed by a combination of electron backscatter diffraction and electron channeling contrast imaging using low-energy incident electrons. Both techniques allowed clear identification of a nano-thick amorphous oxide layer, on top of the polycrystalline substrate, for the plasma-modified samples. A methodology was developed using Monte Carlo simulations combined with the experimental results to estimate thickness of the amorphous layer for different surface conditions. X-ray photoelectron spectroscopy depth profiles were used to validate these estimations.

Palavras-chave

amorphous; microstructure; oxide layer; surface modification; thickness

Buscar no Google

Imprimir

XML

PubMed Links