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Improving thermoelectric performance of TiNiSn by mixing MnNiSb in the half-Heusler structure.
Berry, T; Ouardi, S; Fecher, G H; Balke, B; Kreiner, G; Auffermann, G; Schnelle, W; Felser, C.
Afiliação
  • Berry T; Max Planck Institute for Chemical Physics of Solids, Nöthnitzer Str. 40, 01187 Dresden, Germany. Gerhard.Fecher@cpfs.mpg.de.
  • Ouardi S; Johannes Gutenberg University Mainz, Staudingerweg 9, 55128 Mainz, Germany.
  • Fecher GH; Max Planck Institute for Chemical Physics of Solids, Nöthnitzer Str. 40, 01187 Dresden, Germany. Gerhard.Fecher@cpfs.mpg.de.
  • Balke B; Johannes Gutenberg University Mainz, Staudingerweg 9, 55128 Mainz, Germany.
  • Kreiner G; Max Planck Institute for Chemical Physics of Solids, Nöthnitzer Str. 40, 01187 Dresden, Germany. Gerhard.Fecher@cpfs.mpg.de.
  • Auffermann G; Max Planck Institute for Chemical Physics of Solids, Nöthnitzer Str. 40, 01187 Dresden, Germany. Gerhard.Fecher@cpfs.mpg.de.
  • Schnelle W; Max Planck Institute for Chemical Physics of Solids, Nöthnitzer Str. 40, 01187 Dresden, Germany. Gerhard.Fecher@cpfs.mpg.de.
  • Felser C; Max Planck Institute for Chemical Physics of Solids, Nöthnitzer Str. 40, 01187 Dresden, Germany. Gerhard.Fecher@cpfs.mpg.de.
Phys Chem Chem Phys ; 19(2): 1543-1550, 2017 Jan 04.
Article em En | MEDLINE | ID: mdl-27990549
ABSTRACT
The thermoelectric properties of the n-type semiconductor TiNiSn were optimized by partial substitution with metallic MnNiSb in the half Heusler structure. Herein, we study the transport properties and intrinsic phase separation in the Ti1-xMnxNiSn1-xSbx system. The alloys were prepared by arc-melting and annealed at temperatures obtained from differential thermal analysis and differential scanning calorimetry results. The phases were characterized using powder X-ray diffraction patterns, energy-dispersive X-ray spectroscopy, and differential scanning calorimetry. After annealing, the majority phase was TiNiSn with some Ni-rich sites, and the minority phases were primarily Ti6Sn5, Sn and MnSn2. The Ni-rich sites were caused by Frenkel defects; this led to metal-like behavior in the semiconductor specimens at low temperature. For x ≤ 0.05 the samples showed an activated conduction, whereas for x > 0.05 they showed metallic character. The figure of merit for x = 0.05 was increased by 61% (zT = 0.45) in comparison with the pure TiNiSn.

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2017 Tipo de documento: Article

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2017 Tipo de documento: Article