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Molecular hydrogen production from amorphous solid water during low energy electron irradiation.
Gadallah, Kamel A K; Marchione, Demian; Koehler, Sven P K; McCoustra, Martin R S.
Afiliação
  • Gadallah KA; School of Engineering and Physical Sciences, Heriot-Watt University, Riccarton, Edinburgh EH14 4AS, UK and Astronomy & Meteorology Department, Faculty of Science, Al-Azhar University, Nasr City, PO Box 11884, Cairo, Egypt. Kamel.Gadallah71@Gmail.com.
  • Marchione D; School of Engineering and Physical Sciences, Heriot-Watt University, Riccarton, Edinburgh EH14 4AS, UK and Science Division, Jet Propulsion Laboratory, California Institute of Technology, Pasadena, CA 91109, USA.
  • Koehler SP; School of Chemistry, The University of Manchester, Manchester, M13 9PL, UK and Dalton Cumbrian Facility, The University of Manchester, Westlakes Science & Technology Park, Moor Row, CA24 3HA, UK.
  • McCoustra MR; School of Engineering and Physical Sciences, Heriot-Watt University, Riccarton, Edinburgh EH14 4AS, UK.
Phys Chem Chem Phys ; 19(4): 3349-3357, 2017 Jan 25.
Article em En | MEDLINE | ID: mdl-28091646
ABSTRACT
This work investigates the production of molecular hydrogen isotopologues (H2, HD, and D2) during low energy electron irradiation of layered and isotopically labelled thin films of amorphous solid water (ASW) in ultrahigh vacuum. Experimentally, the production of these molecules with both irradiation time and incident electron energy in the range 400 to 500 eV is reported as a function of the depth of a buried D2O layer in an H2O film. H2 is produced consistently in all measurements, reflecting the H2O component of the film, though it does exhibit a modest reduction in intensity at the time corresponding to product escape from the buried D2O layer. In contrast, HD and D2 production exhibit peaks at times corresponding to product escape from the buried D2O layer in the composite film. These features broaden the deeper the HD or D2 is formed due to diffusion. A simple random-walk model is presented that can qualitatively explain the appearance profile of these peaks as a function of the incident electron penetration.

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2017 Tipo de documento: Article

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2017 Tipo de documento: Article