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Transmission scanning electron microscopy: Defect observations and image simulations.
Callahan, Patrick G; Stinville, Jean-Charles; Yao, Eric R; Echlin, McLean P; Titus, Michael S; De Graef, Marc; Gianola, Daniel S; Pollock, Tresa M.
Afiliação
  • Callahan PG; Materials Department, University of California Santa Barbara, Santa Barbara, CA 93106, USA. Electronic address: pcallahan@engineering.ucsb.edu.
  • Stinville JC; Materials Department, University of California Santa Barbara, Santa Barbara, CA 93106, USA. Electronic address: stinville@engineering.ucsb.edu.
  • Yao ER; Materials Department, University of California Santa Barbara, Santa Barbara, CA 93106, USA. Electronic address: ericyao@umail.ucsb.edu.
  • Echlin MP; Materials Department, University of California Santa Barbara, Santa Barbara, CA 93106, USA. Electronic address: mechlin@engineering.ucsb.edu.
  • Titus MS; Materials Department, University of California Santa Barbara, Santa Barbara, CA 93106, USA; School of Materials Engineering, Purdue University, West Lafayette, IN 47907, USA. Electronic address: titus9@purdue.edu.
  • De Graef M; Department of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh, PA 15213, USA. Electronic address: degraef@cmu.edu.
  • Gianola DS; Materials Department, University of California Santa Barbara, Santa Barbara, CA 93106, USA. Electronic address: gianola@engineering.ucsb.edu.
  • Pollock TM; Materials Department, University of California Santa Barbara, Santa Barbara, CA 93106, USA. Electronic address: pollock@engineering.ucsb.edu.
Ultramicroscopy ; 186: 49-61, 2018 03.
Article em En | MEDLINE | ID: mdl-29268135
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2018 Tipo de documento: Article
Texto completo
Imprimir
XML
PubMed Links
Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2018 Tipo de documento: Article