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Dielectric Engineering of Electronic Correlations in a van der Waals Heterostructure.
Steinleitner, Philipp; Merkl, Philipp; Graf, Alexander; Nagler, Philipp; Watanabe, Kenji; Taniguchi, Takashi; Zipfel, Jonas; Schüller, Christian; Korn, Tobias; Chernikov, Alexey; Brem, Samuel; Selig, Malte; Berghäuser, Gunnar; Malic, Ermin; Huber, Rupert.
Afiliação
  • Steinleitner P; Department of Physics, University of Regensburg , Universitätsstraße 31, 93053 Regensburg, Germany.
  • Merkl P; Department of Physics, University of Regensburg , Universitätsstraße 31, 93053 Regensburg, Germany.
  • Graf A; Department of Physics, University of Regensburg , Universitätsstraße 31, 93053 Regensburg, Germany.
  • Nagler P; Department of Physics, University of Regensburg , Universitätsstraße 31, 93053 Regensburg, Germany.
  • Watanabe K; National Institute for Material Science , 305-0044 1-1 Namiki Tsukuba, Ibaraki, Japan.
  • Taniguchi T; National Institute for Material Science , 305-0044 1-1 Namiki Tsukuba, Ibaraki, Japan.
  • Zipfel J; Department of Physics, University of Regensburg , Universitätsstraße 31, 93053 Regensburg, Germany.
  • Schüller C; Department of Physics, University of Regensburg , Universitätsstraße 31, 93053 Regensburg, Germany.
  • Korn T; Department of Physics, University of Regensburg , Universitätsstraße 31, 93053 Regensburg, Germany.
  • Chernikov A; Department of Physics, University of Regensburg , Universitätsstraße 31, 93053 Regensburg, Germany.
  • Brem S; Department of Physics, Chalmers University of Technology , Fysikgården 1, 41258 Gothenburg, Sweden.
  • Selig M; Department of Theoretical Physics, Technical University of Berlin , Hardenbergstraße 36, 10623 Berlin, Germany.
  • Berghäuser G; Department of Physics, Chalmers University of Technology , Fysikgården 1, 41258 Gothenburg, Sweden.
  • Malic E; Department of Physics, Chalmers University of Technology , Fysikgården 1, 41258 Gothenburg, Sweden.
  • Huber R; Department of Physics, University of Regensburg , Universitätsstraße 31, 93053 Regensburg, Germany.
Nano Lett ; 18(2): 1402-1409, 2018 02 14.
Article em En | MEDLINE | ID: mdl-29365262
Heterostructures of van der Waals bonded layered materials offer unique means to tailor dielectric screening with atomic-layer precision, opening a fertile field of fundamental research. The optical analyses used so far have relied on interband spectroscopy. Here we demonstrate how a capping layer of hexagonal boron nitride (hBN) renormalizes the internal structure of excitons in a WSe2 monolayer using intraband transitions. Ultrabroadband terahertz probes sensitively map out the full complex-valued mid-infrared conductivity of the heterostructure after optical injection of 1s A excitons. This approach allows us to trace the energies and line widths of the atom-like 1s-2p transition of optically bright and dark excitons as well as the densities of these quasiparticles. The excitonic resonance red shifts and narrows in the WSe2/hBN heterostructure compared to the bare monolayer. Furthermore, the ultrafast temporal evolution of the mid-infrared response function evidences the formation of optically dark excitons from an initial bright population. Our results provide key insight into the effect of nonlocal screening on electron-hole correlations and open new possibilities of dielectric engineering of van der Waals heterostructures.
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2018 Tipo de documento: Article

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2018 Tipo de documento: Article