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Nanoscale Relative Emission Efficiency Mapping Using Cathodoluminescence g(2) Imaging.
Meuret, Sophie; Coenen, Toon; Woo, Steffi Y; Ra, Yong-Ho; Mi, Zetian; Polman, Albert.
Afiliação
  • Meuret S; Center for Nanophotonics , AMOLF , Science Park 104 , 1098 XG Amsterdam , The Netherlands.
  • Coenen T; Center for Nanophotonics , AMOLF , Science Park 104 , 1098 XG Amsterdam , The Netherlands.
  • Woo SY; The Netherlands Delmic BV , Kanaalweg 4 , 2628 EB Delft , The Netherlands.
  • Ra YH; Department of Materials Science and Engineering, Canadian Centre for Electron Microscopy , McMaster University , 1280 Main Street West , Hamilton , Ontario L8S 4M1 , Canada.
  • Mi Z; Department of Electrical and Computer Engineering , McGill University , 3480 University Street , Montreal , Quebec H3A 0E9 , Canada.
  • Polman A; Optic & Display Material Center , Korea Institute of Ceramic Engineering & Technology , Jinju 52851 , Republic of Korea.
Nano Lett ; 18(4): 2288-2293, 2018 04 11.
Article em En | MEDLINE | ID: mdl-29546762
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Tipo de estudo: Prognostic_studies Idioma: En Ano de publicação: 2018 Tipo de documento: Article
Texto completo
Imprimir
XML
PubMed Links
Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Tipo de estudo: Prognostic_studies Idioma: En Ano de publicação: 2018 Tipo de documento: Article