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Image registration of low signal-to-noise cryo-STEM data.
Savitzky, Benjamin H; El Baggari, Ismail; Clement, Colin B; Waite, Emily; Goodge, Berit H; Baek, David J; Sheckelton, John P; Pasco, Christopher; Nair, Hari; Schreiber, Nathaniel J; Hoffman, Jason; Admasu, Alemayehu S; Kim, Jaewook; Cheong, Sang-Wook; Bhattacharya, Anand; Schlom, Darrell G; McQueen, Tyrel M; Hovden, Robert; Kourkoutis, Lena F.
Afiliação
  • Savitzky BH; Department of Physics, Cornell University, Ithaca, NY 14853 USA. Electronic address: bhs94@cornell.edu.
  • El Baggari I; Department of Physics, Cornell University, Ithaca, NY 14853 USA.
  • Clement CB; Department of Physics, Cornell University, Ithaca, NY 14853 USA.
  • Waite E; School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853 USA.
  • Goodge BH; School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853 USA.
  • Baek DJ; School of Electrical and Computer Engineering, Cornell University, Ithaca, NY 14853, USA.
  • Sheckelton JP; Department of Chemistry, The Johns Hopkins University, Baltimore, MD 21218 USA.
  • Pasco C; Department of Chemistry, The Johns Hopkins University, Baltimore, MD 21218 USA.
  • Nair H; Department of Materials Science and Engineering, Cornell University, Ithaca, NY 14853, USA.
  • Schreiber NJ; Department of Materials Science and Engineering, Cornell University, Ithaca, NY 14853, USA.
  • Hoffman J; Center for Nanoscale Materials and Materials Science Division, Argonne National Laboratory, Argonne, IL 60439, USA; Present Address: Department of Physics, Harvard University, Cambridge, MA 02138, USA.
  • Admasu AS; Rutgers Center for Emergent Materials and Department of Physics and Astronomy, Rutgers University, Piscataway, NJ 08854, USA.
  • Kim J; Rutgers Center for Emergent Materials and Department of Physics and Astronomy, Rutgers University, Piscataway, NJ 08854, USA.
  • Cheong SW; Rutgers Center for Emergent Materials and Department of Physics and Astronomy, Rutgers University, Piscataway, NJ 08854, USA.
  • Bhattacharya A; Center for Nanoscale Materials and Materials Science Division, Argonne National Laboratory, Argonne, IL 60439, USA.
  • Schlom DG; Department of Materials Science and Engineering, Cornell University, Ithaca, NY 14853, USA; Kavli Institute at Cornell for Nanoscale Science, Cornell University, Ithaca, NY 14853 USA.
  • McQueen TM; Department of Chemistry, The Johns Hopkins University, Baltimore, MD 21218 USA.
  • Hovden R; School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853 USA; Present Address: Department of Materials Science and Engineering, University of Michigan, Ann Arbor, MI 48109 USA.
  • Kourkoutis LF; School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853 USA; Kavli Institute at Cornell for Nanoscale Science, Cornell University, Ithaca, NY 14853 USA. Electronic address: lena.f.kourkoutis@cornell.edu.
Ultramicroscopy ; 191: 56-65, 2018 08.
Article em En | MEDLINE | ID: mdl-29843097
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2018 Tipo de documento: Article
Texto completo
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2018 Tipo de documento: Article