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High resolution XUV Fourier transform holography on a table top.
Tadesse, G K; Eschen, W; Klas, R; Hilbert, V; Schelle, D; Nathanael, A; Zilk, M; Steinert, M; Schrempel, F; Pertsch, T; Tünnermann, A; Limpert, J; Rothhardt, J.
Afiliação
  • Tadesse GK; Helmholtz-Institute Jena, Fröbelstieg 3, 07743, Jena, Germany.
  • Eschen W; Institute of Applied Physics, Abbe Center of Photonics, Friedrich Schiller University Jena, Albert-Einstein-Straße 15, 07745, Jena, Germany.
  • Klas R; Institute of Applied Physics, Abbe Center of Photonics, Friedrich Schiller University Jena, Albert-Einstein-Straße 15, 07745, Jena, Germany.
  • Hilbert V; Helmholtz-Institute Jena, Fröbelstieg 3, 07743, Jena, Germany.
  • Schelle D; Institute of Applied Physics, Abbe Center of Photonics, Friedrich Schiller University Jena, Albert-Einstein-Straße 15, 07745, Jena, Germany.
  • Nathanael A; Institute of Applied Physics, Abbe Center of Photonics, Friedrich Schiller University Jena, Albert-Einstein-Straße 15, 07745, Jena, Germany.
  • Zilk M; Institute of Applied Physics, Abbe Center of Photonics, Friedrich Schiller University Jena, Albert-Einstein-Straße 15, 07745, Jena, Germany.
  • Steinert M; Institute of Applied Physics, Abbe Center of Photonics, Friedrich Schiller University Jena, Albert-Einstein-Straße 15, 07745, Jena, Germany.
  • Schrempel F; Institute of Applied Physics, Abbe Center of Photonics, Friedrich Schiller University Jena, Albert-Einstein-Straße 15, 07745, Jena, Germany.
  • Pertsch T; Institute of Applied Physics, Abbe Center of Photonics, Friedrich Schiller University Jena, Albert-Einstein-Straße 15, 07745, Jena, Germany.
  • Tünnermann A; Institute of Applied Physics, Abbe Center of Photonics, Friedrich Schiller University Jena, Albert-Einstein-Straße 15, 07745, Jena, Germany.
  • Limpert J; Institute of Applied Physics, Abbe Center of Photonics, Friedrich Schiller University Jena, Albert-Einstein-Straße 15, 07745, Jena, Germany.
  • Rothhardt J; Helmholtz-Institute Jena, Fröbelstieg 3, 07743, Jena, Germany.
Sci Rep ; 8(1): 8677, 2018 Jun 06.
Article em En | MEDLINE | ID: mdl-29875479
Today, coherent imaging techniques provide the highest resolution in the extreme ultraviolet (XUV) and X-ray regions. Fourier transform holography (FTH) is particularly unique, providing robust and straightforward image reconstruction at the same time. Here, we combine two important advances: First, our experiment is based on a table-top light source which is compact, scalable and highly accessible. Second, we demonstrate the highest resolution ever achieved with FTH at any light source (34 nm) by utilizing a high photon flux source and cutting-edge nanofabrication technology. The performance, versatility and reliability of our approach allows imaging of complex wavelength-scale structures, including wave guiding effects within these structures, and resolving embedded nanoscale features, which are invisible for electron microscopes. Our work represents an important step towards real-world applications and a broad use of XUV imaging in many areas of science and technology. Even nanoscale studies of ultra-fast dynamics are within reach.

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2018 Tipo de documento: Article

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2018 Tipo de documento: Article