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Exit-wave phase retrieval from a single high-resolution transmission electron microscopy image of a weak-phase object.
Lin, F; Ren, X B; Zhou, W P; Zhang, L Y; Xiao, Y; Zhang, Q; Xu, H T; Li, H; Jin, C H.
Afiliação
  • Lin F; College of Electronic Engineering, South China Agricultural University, Guangzhou, Guangdong, 510642, China; State Key Laboratory of Silicon Materials, School of Materials Science and Engineering, Zhejiang University, Hangzhou, 310027, China. Electronic address: flin_rew@163.com.
  • Ren XB; State Key Laboratory of Silicon Materials, School of Materials Science and Engineering, Zhejiang University, Hangzhou, 310027, China.
  • Zhou WP; College of Electronic Engineering, South China Agricultural University, Guangzhou, Guangdong, 510642, China.
  • Zhang LY; College of Electronic Engineering, South China Agricultural University, Guangzhou, Guangdong, 510642, China.
  • Xiao Y; College of Electronic Engineering, South China Agricultural University, Guangzhou, Guangdong, 510642, China.
  • Zhang Q; College of Electronic Engineering, South China Agricultural University, Guangzhou, Guangdong, 510642, China.
  • Xu HT; College of Electronic Engineering, South China Agricultural University, Guangzhou, Guangdong, 510642, China.
  • Li H; College of Electronic Engineering, South China Agricultural University, Guangzhou, Guangdong, 510642, China. Electronic address: lee.361@163.com.
  • Jin CH; State Key Laboratory of Silicon Materials, School of Materials Science and Engineering, Zhejiang University, Hangzhou, 310027, China. Electronic address: chhjin@zju.edu.cn.
Micron ; 114: 23-31, 2018 11.
Article em En | MEDLINE | ID: mdl-30059830
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2018 Tipo de documento: Article
Texto completo
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2018 Tipo de documento: Article