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High-Performance SERS Substrate Based on Hierarchical 3D Cu Nanocrystals with Efficient Morphology Control.
Zhao, Xiaohui; Deng, Min; Rao, Gaofeng; Yan, Yichao; Wu, Chunyang; Jiao, Yu; Deng, Anqing; Yan, Chaoyi; Huang, Jianwen; Wu, Songhao; Chen, Wei; Lei, Tianyu; Xu, Ping; He, Weidong; Xiong, Jie.
Afiliação
  • Zhao X; State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, 610054, P. R. China.
  • Deng M; State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, 610054, P. R. China.
  • Rao G; State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, 610054, P. R. China.
  • Yan Y; State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, 610054, P. R. China.
  • Wu C; State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, 610054, P. R. China.
  • Jiao Y; School of Applied and Chemical Engineering, Xichang College, Xichang, 615053, P. R. China.
  • Deng A; Faculty of Science, Zhejiang University, Hangzhou, 310012, P. R. China.
  • Yan C; State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, 610054, P. R. China.
  • Huang J; State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, 610054, P. R. China.
  • Wu S; School of Physics, University of Electronic Science and Technology of China, Chengdu, 610054, P. R. China.
  • Chen W; State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, 610054, P. R. China.
  • Lei T; State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, 610054, P. R. China.
  • Xu P; MIIT Key Laboratory of Critical Materials Technology for New Energy Conversion and Storage School of Chemistry and Chemical Engineering, Harbin Institute of Technology, Harbin, 150001, P. R. China.
  • He W; School of Physics, University of Electronic Science and Technology of China, Chengdu, 610054, P. R. China.
  • Xiong J; State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, 610054, P. R. China.
Small ; 14(38): e1802477, 2018 09.
Article em En | MEDLINE | ID: mdl-30146774
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2018 Tipo de documento: Article
Texto completo
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XML
PubMed Links
Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2018 Tipo de documento: Article