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Graphene used as a lateral force microscopy calibration material in the low-load non-linear regime.
Boland, Mathias J; Hempel, Jacob L; Ansary, Armin; Nasseri, Mohsen; Strachan, Douglas R.
Afiliação
  • Boland MJ; Department of Physics and Astronomy, University of Kentucky, Lexington, Kentucky 40506, USA.
  • Hempel JL; Department of Physics and Astronomy, University of Kentucky, Lexington, Kentucky 40506, USA.
  • Ansary A; Department of Physics and Astronomy, University of Kentucky, Lexington, Kentucky 40506, USA.
  • Nasseri M; Department of Physics and Astronomy, University of Kentucky, Lexington, Kentucky 40506, USA.
  • Strachan DR; Department of Physics and Astronomy, University of Kentucky, Lexington, Kentucky 40506, USA.
Rev Sci Instrum ; 89(11): 113902, 2018 Nov.
Article em En | MEDLINE | ID: mdl-30501363
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Tipo de estudo: Prognostic_studies Idioma: En Ano de publicação: 2018 Tipo de documento: Article
Texto completo
Imprimir
XML
PubMed Links
Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Tipo de estudo: Prognostic_studies Idioma: En Ano de publicação: 2018 Tipo de documento: Article