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Evaluation of spatial and temporal resolution on in situ annealing aberration-corrected transmission electron microscopy with proportional-integral-differential controller.
Shimada, Yusuke; Yoshida, Kenta; Inoue, Koji; Shiraishi, Takahisa; Kiguchi, Takanori; Nagai, Yasuyoshi; Konno, Toyohiko J.
Afiliação
  • Shimada Y; Institute for Materials Research, Tohoku University, Katahira, Aoba-ku, Sendai, Miyagi, Japan.
  • Yoshida K; International Research Center for Nuclear Materials Science, Institute for Materials Research, Tohoku University, Oarai, Ibaraki, Japan.
  • Inoue K; International Research Center for Nuclear Materials Science, Institute for Materials Research, Tohoku University, Oarai, Ibaraki, Japan.
  • Shiraishi T; Institute for Materials Research, Tohoku University, Katahira, Aoba-ku, Sendai, Miyagi, Japan.
  • Kiguchi T; Institute for Materials Research, Tohoku University, Katahira, Aoba-ku, Sendai, Miyagi, Japan.
  • Nagai Y; International Research Center for Nuclear Materials Science, Institute for Materials Research, Tohoku University, Oarai, Ibaraki, Japan.
  • Konno TJ; Institute for Materials Research, Tohoku University, Katahira, Aoba-ku, Sendai, Miyagi, Japan.
Microscopy (Oxf) ; 68(3): 271-278, 2019 Jun 01.
Article em En | MEDLINE | ID: mdl-30843044
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2019 Tipo de documento: Article
Texto completo
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XML
PubMed Links
Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2019 Tipo de documento: Article