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Ferroelectricity in Polar Polymer-based FETs: A Hysteresis Analysis.
Georgiou, Vasileia; Veksler, Dmitry; Campbell, Jason P; Shrestha, Pragya R; Ryan, Jason T; Ioannou, Dimitris E; Cheung, Kin P.
Afiliação
  • Georgiou V; Engineering Physics Division, National Institute of Standards and Technology, 100 Bureau Drive, MS 8120, Gaithersburg, Maryland 20899, United States.
  • Veksler D; Engineering Physics Division, National Institute of Standards and Technology, 100 Bureau Drive, MS 8120, Gaithersburg, Maryland 20899, United States.
  • Campbell JP; Engineering Physics Division, National Institute of Standards and Technology, 100 Bureau Drive, MS 8120, Gaithersburg, Maryland 20899, United States.
  • Shrestha PR; Engineering Physics Division, National Institute of Standards and Technology, 100 Bureau Drive, MS 8120, Gaithersburg, Maryland 20899, United States.
  • Ryan JT; Engineering Physics Division, National Institute of Standards and Technology, 100 Bureau Drive, MS 8120, Gaithersburg, Maryland 20899, United States.
  • Ioannou DE; Department of Electrical and Computer Engineering, George Mason University, 4400 University Drive, Fairfax, Virginia 22030, United States.
  • Cheung KP; Engineering Physics Division, National Institute of Standards and Technology, 100 Bureau Drive, MS 8120, Gaithersburg, Maryland 20899, United States.
Article em En | MEDLINE | ID: mdl-31080381
ABSTRACT
There is an increasing number of reports on polar polymer-based Ferroelectric Field Effect Transistors (FeFETs), where the hysteresis of the drain current - gate voltage (Id-Vg) curve is investigated as the result of the ferroelectric polarization effect. However, separating ferroelectric effect from many of the factors (such as charge injection/trapping and the presence of mobile ions in the polymer) that confound interpretation is still confusing and controversial. This work presents a methodology to reliably identify the confounding factors which obscure the polarization effect in FeFETs. Careful observation of the Id-Vg curves, as well as monitoring the Id-Vg hysteresis and flat band voltage shift as a function of temperature and sweep frequency identifies the dominant mechanism. This methodology is demonstrated using 15-nm thick high glass transition temperature polar polymer-based FeFETs. In these devices, room temperature hysteresis is largely a consequence of charge trapping and mobile ions, while ferroelectric polarization is observed at elevated temperatures. This methodology can be used to unambiguously prove the effect of ferroelectric polarization in FeFETs.
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Tipo de estudo: Prognostic_studies Idioma: En Ano de publicação: 2018 Tipo de documento: Article

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Tipo de estudo: Prognostic_studies Idioma: En Ano de publicação: 2018 Tipo de documento: Article