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Extent of conjugation in diazonium-derived layers in molecular junction devices determined by experiment and modelling.
Van Dyck, Colin; Bergren, Adam Johan; Mukundan, Vineetha; Fereiro, Jerry A; DiLabio, Gino A.
Afiliação
  • Van Dyck C; Nanotechnology Research Centre, National Research Council of Canada, 11427 Saskatchewan Drive, Edmonton, Alberta T6G 2M9, Canada. Adam.Bergren@nrc.ca.
  • Bergren AJ; Nanotechnology Research Centre, National Research Council of Canada, 11427 Saskatchewan Drive, Edmonton, Alberta T6G 2M9, Canada. Adam.Bergren@nrc.ca.
  • Mukundan V; Department of Chemistry, University of Alberta, Edmonton, Alberta, Canada.
  • Fereiro JA; Department of Chemistry, University of Alberta, Edmonton, Alberta, Canada.
  • DiLabio GA; Department of Chemistry, The University of British Columbia, 3247 University Way, Kelowna, British Columbia V1V 1V7, Canada. Gino.DiLabio@ubc.ca and Faculty of Management, The University of British Columbia, 1137 Alumni Ave, Kelowna, British Columbia V1V 1V7, Canada.
Phys Chem Chem Phys ; 21(30): 16762-16770, 2019 Aug 14.
Article em En | MEDLINE | ID: mdl-31328202
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Tipo de estudo: Prognostic_studies Idioma: En Ano de publicação: 2019 Tipo de documento: Article
Texto completo
Imprimir
XML
PubMed Links
Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Tipo de estudo: Prognostic_studies Idioma: En Ano de publicação: 2019 Tipo de documento: Article