An in situ characterization technique for electron emission behavior under a photo-electric-common-excitation field: study on the vertical few-layer graphene individuals.

Shen, Yan; Xing, Yang; Wang, Hao; Xu, Ningsheng; Gong, Li; Wen, Jinxiu; Chen, Xuexian; Zhan, Runze; Chen, Huanjun; Zhang, Yu; Liu, Fei; Chen, Jun; She, Juncong; Deng, Shaozhi

Shen, Yan; Xing, Yang; Wang, Hao; Xu, Ningsheng; Gong, Li; Wen, Jinxiu; Chen, Xuexian; Zhan, Runze; Chen, Huanjun; Zhang, Yu; Liu, Fei; Chen, Jun; She, Juncong; Deng, Shaozhi.

Afiliação

Shen Y; State Key Laboratory of Optoelectronic Materials and Technologies, Guangdong Province Key Laboratory of Display Material and Technology, School of Electronics and Information Technology, Sun Yat-sen University, Guangzhou 510275, People's Republic of China.

Nanotechnology ; 30(44): 445202, 2019 11 01.

Article em En | MEDLINE | ID: mdl-31349235

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2019 Tipo de documento: Article

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2019 Tipo de documento: Article