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Simultaneous scanning near-field optical and X-ray diffraction microscopy for correlative nanoscale structure-property characterization.
Li, Qian; Marks, Samuel D; Bean, Sunil; Fisher, Michael; Walko, Donald A; DiChiara, Anthony D; Chen, Xinzhong; Imura, Keiichiro; Sato, Noriaki K; Liu, Mengkun; Evans, Paul G; Wen, Haidan.
Afiliação
  • Li Q; Advanced Photon Source, Argonne National Laboratory, Lemont, IL 60439, USA.
  • Marks SD; Advanced Photon Source, Argonne National Laboratory, Lemont, IL 60439, USA.
  • Bean S; Advanced Photon Source, Argonne National Laboratory, Lemont, IL 60439, USA.
  • Fisher M; Advanced Photon Source, Argonne National Laboratory, Lemont, IL 60439, USA.
  • Walko DA; Advanced Photon Source, Argonne National Laboratory, Lemont, IL 60439, USA.
  • DiChiara AD; Advanced Photon Source, Argonne National Laboratory, Lemont, IL 60439, USA.
  • Chen X; Department of Physics, Stony Brook University, Stony Brook, NY 11794, USA.
  • Imura K; Department of Physics, Nagoya University, Nagoya 464-8602, Japan.
  • Sato NK; Department of Physics, Nagoya University, Nagoya 464-8602, Japan.
  • Liu M; Department of Physics, Stony Brook University, Stony Brook, NY 11794, USA.
  • Evans PG; Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI 53706, USA.
  • Wen H; Advanced Photon Source, Argonne National Laboratory, Lemont, IL 60439, USA.
J Synchrotron Radiat ; 26(Pt 5): 1790-1796, 2019 Sep 01.
Article em En | MEDLINE | ID: mdl-31490171
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2019 Tipo de documento: Article
Texto completo
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2019 Tipo de documento: Article