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Molecularly Thin Electrolyte for All Solid-State Nonvolatile Two-Dimensional Crystal Memory.
Liang, Jierui; Xu, Ke; Wu, Maokun; Hunt, Benjamin M; Wang, Wei-Hua; Cho, Kyeongjae; Fullerton-Shirey, Susan K.
Afiliação
  • Liang J; Department of Chemical and Petroleum Engineering , University of Pittsburgh , Pittsburgh , Pennsylvania 15260 , United States.
  • Xu K; Department of Chemical and Petroleum Engineering , University of Pittsburgh , Pittsburgh , Pennsylvania 15260 , United States.
  • Wu M; Department of Electronic Science and Engineering and Tianjin Key Laboratory of Photo-Electronic Thin Film Device and Technology , Nankai University , Tianjin 300071 , P.R. China.
  • Hunt BM; Department of Physics , Carnegie Mellon University , Pittsburgh , Pennsylvania 15213 , United States.
  • Wang WH; Department of Electronic Science and Engineering and Tianjin Key Laboratory of Photo-Electronic Thin Film Device and Technology , Nankai University , Tianjin 300071 , P.R. China.
  • Cho K; Department of Materials Science and Engineering , The University of Texas at Dallas , Richardson , Texas 75080 , United States.
  • Fullerton-Shirey SK; Department of Chemical and Petroleum Engineering , University of Pittsburgh , Pittsburgh , Pennsylvania 15260 , United States.
Nano Lett ; 19(12): 8911-8919, 2019 12 11.
Article em En | MEDLINE | ID: mdl-31661286
ABSTRACT
A molecularly thin electrolyte is developed to demonstrate a nonvolatile, solid-state, one-transistor (1T) memory based on an electric-double-layer (EDL) gated WSe2 field-effect transistor (FET). The custom-designed monolayer electrolyte consists of cobalt crown ether phthalocyanine and lithium ions, which are positioned by field-effect at either the surface of the WSe2 channel or an h-BN capping layer to achieve "1" or "0", respectively. Bistability in the monolayer electrolyte memory is significantly improved by the h-BN cap with density functional theory (DFT) calculations showing enhanced trapping of Li+ near h-BN due to a ∼1.34 eV increase in the absolute value of the adsorption energy compared to vacuum. The threshold voltage shift between the two states corresponds to a change in charge density of ∼2.5 × 1012 cm-2, and an On/Off ratio exceeding 104 at a back gate voltage of 0 V. The On/Off ratio remains stable after 1000 cycles and the retention time for each state exceeds 6 h (max measured). When the write time approaches 1 ms, the On/Off ratio remains >102, showing that the monolayer electrolyte-gated FET can respond on time scales similar to existing flash memory. The data suggest that faster switching times and lower switching voltages could be feasible by top gating.
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2019 Tipo de documento: Article

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2019 Tipo de documento: Article