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Quantitative determination of atomic buckling of silicene by atomic force microscopy.
Pawlak, Rémy; Drechsel, Carl; D'Astolfo, Philipp; Kisiel, Marcin; Meyer, Ernst; Cerda, Jorge Iribas.
Afiliação
  • Pawlak R; Department of Physics, University of Basel, CH 4056 Basel, Switzerland; remy.pawlak@unibas.ch jcerda@icmm.csic.es.
  • Drechsel C; Department of Physics, University of Basel, CH 4056 Basel, Switzerland.
  • D'Astolfo P; Department of Physics, University of Basel, CH 4056 Basel, Switzerland.
  • Kisiel M; Department of Physics, University of Basel, CH 4056 Basel, Switzerland.
  • Meyer E; Department of Physics, University of Basel, CH 4056 Basel, Switzerland.
  • Cerda JI; Instituto de Ciencia de Materiales de Madrid (ICMM), Consejo Superior de Investigaciones Cientificas (CSIC), 28049 Madrid, Spain remy.pawlak@unibas.ch jcerda@icmm.csic.es.
Proc Natl Acad Sci U S A ; 117(1): 228-237, 2020 Jan 07.
Article em En | MEDLINE | ID: mdl-31871150
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2020 Tipo de documento: Article
Texto completo
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2020 Tipo de documento: Article