Your browser doesn't support javascript.
loading
Facet-Dependent Surface Trap States and Carrier Lifetimes of Silicon.
Tan, Chih-Shan; Zhao, Yicheng; Guo, Rong-Hao; Chuang, Wei-Tsung; Chen, Lih-Juann; Huang, Michael H.
Afiliação
  • Tan CS; Department of Materials Science and Engineering and Frontier Research Center on Fundamental and Applied Sciences of Matters, National Tsing Hua University, Hsinchu 30013, Taiwan.
  • Zhao Y; Institute of Materials for Electronics and Energy Technology (i-MEET), Friedrich-Alexander-Universitat Erlangen-Nürnberg (FAU), 91058 Erlangen, Germany.
  • Guo RH; National Synchrotron Radiation Research Center (NSRRC), Hsinchu 30076, Taiwan.
  • Chuang WT; National Synchrotron Radiation Research Center (NSRRC), Hsinchu 30076, Taiwan.
  • Chen LJ; Department of Materials Science and Engineering and Frontier Research Center on Fundamental and Applied Sciences of Matters, National Tsing Hua University, Hsinchu 30013, Taiwan.
  • Huang MH; Department of Chemistry and Frontier Research Center on Fundamental and Applied Sciences of Matters, National Tsing Hua University, Hsinchu 30013, Taiwan.
Nano Lett ; 20(3): 1952-1958, 2020 Mar 11.
Article em En | MEDLINE | ID: mdl-32023411
Palavras-chave
Texto completo
Imprimir
XML
PubMed Links
Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2020 Tipo de documento: Article
Texto completo
Imprimir
XML
PubMed Links
Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2020 Tipo de documento: Article