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Interlaboratory comparison of nanoparticle size measurements between NMIJ and NIST using two different types of dynamic light scattering instruments.
Takahashi, Kayori; Kramar, John A; Farkas, Natalia; Takahata, Keiji; Misumi, Ichiko; Sugawara, Kentaro; Gonda, Satoshi; Ehara, Kensei.
Afiliação
  • Takahashi K; National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8563, Japan.
  • Kramar JA; Microsystems and Nanotechnology Division, National Institute of Standards and Technology (NIST), Gaithersburg, MD 20899, USA.
  • Farkas N; Theiss Research, 7411 Eads Ave, La Jolla, CA 92037, USA.
  • Takahata K; National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8563, Japan.
  • Misumi I; National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8563, Japan.
  • Sugawara K; National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8563, Japan.
  • Gonda S; National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8563, Japan.
  • Ehara K; National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8563, Japan.
Metrologia ; 56(5)2019.
Article em En | MEDLINE | ID: mdl-32116391
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2019 Tipo de documento: Article
Texto completo
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XML
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2019 Tipo de documento: Article