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X-ray diffraction using focused-ion-beam-prepared single crystals.
Weigel, Tina; Funke, Claudia; Zschornak, Matthias; Behm, Thomas; Stöcker, Hartmut; Leisegang, Tilmann; Meyer, Dirk C.
Afiliação
  • Weigel T; Institute of Experimental Physics, Technische Universität Bergakademie Freiberg, Leipziger Strasse 23, 09596 Freiberg, Germany.
  • Funke C; Institute of Experimental Physics, Technische Universität Bergakademie Freiberg, Leipziger Strasse 23, 09596 Freiberg, Germany.
  • Zschornak M; Institute of Experimental Physics, Technische Universität Bergakademie Freiberg, Leipziger Strasse 23, 09596 Freiberg, Germany.
  • Behm T; Institute of Experimental Physics, Technische Universität Bergakademie Freiberg, Leipziger Strasse 23, 09596 Freiberg, Germany.
  • Stöcker H; Institute of Experimental Physics, Technische Universität Bergakademie Freiberg, Leipziger Strasse 23, 09596 Freiberg, Germany.
  • Leisegang T; Institute of Experimental Physics, Technische Universität Bergakademie Freiberg, Leipziger Strasse 23, 09596 Freiberg, Germany.
  • Meyer DC; Samara State Technical University, Molodogvardeyskaya Street 224, 443100 Samara, Russian Federation.
J Appl Crystallogr ; 53(Pt 3): 614-622, 2020 Jun 01.
Article em En | MEDLINE | ID: mdl-32684876
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2020 Tipo de documento: Article
Texto completo
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2020 Tipo de documento: Article