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A Novel Inspection Technique for Electronic Components Using Thermography (NITECT).
Liu, Haochen; Tinsley, Lawrence; Lam, Wayne; Addepalli, Sri; Liu, Xiaochen; Starr, Andrew; Zhao, Yifan.
Afiliação
  • Liu H; School of Aerospace, Transport and Manufacturing, Cranfield University, Bedford MK43 0AL, UK.
  • Tinsley L; School of Aerospace, Transport and Manufacturing, Cranfield University, Bedford MK43 0AL, UK.
  • Lam W; ITA Labs, The International Tin Association, St Albans AL2 2DD, UK.
  • Addepalli S; School of Aerospace, Transport and Manufacturing, Cranfield University, Bedford MK43 0AL, UK.
  • Liu X; School of Aerospace, Transport and Manufacturing, Cranfield University, Bedford MK43 0AL, UK.
  • Starr A; School of Aerospace, Transport and Manufacturing, Cranfield University, Bedford MK43 0AL, UK.
  • Zhao Y; School of Aerospace, Transport and Manufacturing, Cranfield University, Bedford MK43 0AL, UK.
Sensors (Basel) ; 20(17)2020 Sep 03.
Article em En | MEDLINE | ID: mdl-32899391
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2020 Tipo de documento: Article
Texto completo
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XML
PubMed Links
Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2020 Tipo de documento: Article