Dynamic Effects in Voltage Pulsed Atom Probe.

Rousseau, Loïc; Normand, Antoine; Morgado, Felipe F; Stephenson, Leigh; Gault, Baptiste; Tehrani, Kambiz; Vurpillot, François

Rousseau, Loïc; Normand, Antoine; Morgado, Felipe F; Stephenson, Leigh; Gault, Baptiste; Tehrani, Kambiz; Vurpillot, François.

Afiliação

Rousseau L; Groupe Physique des Matériaux, Université de Rouen, Saint Etienne du Rouvray, Normandie76800, France.
Normand A; ESIGELEC, Avenue Galilée, Saint Etienne du Rouvray, Normandie76800, France.
Morgado FF; Groupe Physique des Matériaux, Université de Rouen, Saint Etienne du Rouvray, Normandie76800, France.
Stephenson L; Max-Planck Institut für Eisenforschung GmbH, DüsseldorfD-40237, Germany.
Gault B; Max-Planck Institut für Eisenforschung GmbH, DüsseldorfD-40237, Germany.
Tehrani K; Max-Planck Institut für Eisenforschung GmbH, DüsseldorfD-40237, Germany.
Vurpillot F; Department of Material, Royal School of Mines, Imperial College, London, UK.

Microsc Microanal ; 26(6): 1133-1146, 2020 Dec.

Article em En | MEDLINE | ID: mdl-33176891

Palavras-chave

Saxey's approach; atom probe; chromatic aberrations; dynamic effects; time-of-flight mass spectrometry

Texto completo

Imprimir

XML

PubMed Links

Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2020 Tipo de documento: Article

Texto completo

Imprimir

XML

PubMed Links

Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2020 Tipo de documento: Article