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Author Correction: Chemical trends of deep levels in van der Waals semiconductors.
Ci, Penghong; Tian, Xuezeng; Kang, Jun; Salazar, Anthony; Eriguchi, Kazutaka; Warkander, Sorren; Tang, Kechao; Liu, Jiaman; Chen, Yabin; Tongay, Sefaattin; Walukiewicz, Wladek; Miao, Jianwei; Dubon, Oscar; Wu, Junqiao.
Afiliação
  • Ci P; Department of Materials Science and Engineering, University of California, Berkeley, CA, 94720, USA.
  • Tian X; Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA, 94720, USA.
  • Kang J; Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, CA, USA.
  • Salazar A; Beijing Computational Science Research Center, Beijing, China.
  • Eriguchi K; Department of Materials Science and Engineering, University of California, Berkeley, CA, 94720, USA.
  • Warkander S; Department of Materials Science and Engineering, University of California, Berkeley, CA, 94720, USA.
  • Tang K; Department of Materials Science and Engineering, University of California, Berkeley, CA, 94720, USA.
  • Liu J; Department of Materials Science and Engineering, University of California, Berkeley, CA, 94720, USA.
  • Chen Y; Department of Materials Science and Engineering, University of California, Berkeley, CA, 94720, USA.
  • Tongay S; Department of Materials Science and Engineering, University of California, Berkeley, CA, 94720, USA.
  • Walukiewicz W; School of Aerospace Engineering, Beijing Institute of Technology, Beijing, China.
  • Miao J; School for Engineering of Matter, Transport, and Energy, Arizona State University, Tempe, AZ, 85287, USA.
  • Dubon O; Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA, 94720, USA.
  • Wu J; Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, CA, USA.
Nat Commun ; 11(1): 6180, 2020 Nov 26.
Article em En | MEDLINE | ID: mdl-33243977
ABSTRACT
A Correction to this paper has been published https//doi.org/10.1038/s41467-020-20151-x.
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2020 Tipo de documento: Article
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2020 Tipo de documento: Article