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Advanced calibration kit for scanning microwave microscope: Design, fabrication, and measurement.
Le Quang, T; Gungor, A C; Vasyukov, D; Hoffmann, J; Smajic, J; Zeier, M.
Afiliação
  • Le Quang T; RF and Microwave Laboratory of the Federal Institute of Metrology METAS of Switzerland, 3003 Bern-Wabern, Switzerland.
  • Gungor AC; Institute of Electromagnetic Fields (IEF), ETH Zurich, 8092 Zurich, Switzerland.
  • Vasyukov D; RF and Microwave Laboratory of the Federal Institute of Metrology METAS of Switzerland, 3003 Bern-Wabern, Switzerland.
  • Hoffmann J; RF and Microwave Laboratory of the Federal Institute of Metrology METAS of Switzerland, 3003 Bern-Wabern, Switzerland.
  • Smajic J; Institute of Electromagnetic Fields (IEF), ETH Zurich, 8092 Zurich, Switzerland.
  • Zeier M; RF and Microwave Laboratory of the Federal Institute of Metrology METAS of Switzerland, 3003 Bern-Wabern, Switzerland.
Rev Sci Instrum ; 92(2): 023705, 2021 Feb 01.
Article em En | MEDLINE | ID: mdl-33648098
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Tipo de estudo: Prognostic_studies Idioma: En Ano de publicação: 2021 Tipo de documento: Article
Texto completo
Imprimir
XML
PubMed Links
Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Tipo de estudo: Prognostic_studies Idioma: En Ano de publicação: 2021 Tipo de documento: Article