A refraction correction for buried interfaces applied to in situ grazing-incidence X-ray diffraction studies on Pd electrodes.

Landers, Alan T; Koshy, David M; Lee, Soo Hong; Drisdell, Walter S; Davis, Ryan C; Hahn, Christopher; Mehta, Apurva; Jaramillo, Thomas F

Landers, Alan T; Koshy, David M; Lee, Soo Hong; Drisdell, Walter S; Davis, Ryan C; Hahn, Christopher; Mehta, Apurva; Jaramillo, Thomas F.

Afiliação

Landers AT; Department of Chemistry, Stanford University, Stanford, CA 94305, USA.
Koshy DM; SUNCAT Center for Interface Science and Catalysis, SLAC National Accelerator Laboratory, Menlo Park, CA 94025, USA.
Lee SH; Joint Center for Artificial Photosynthesis, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA.
Drisdell WS; Joint Center for Artificial Photosynthesis, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA.
Davis RC; Stanford Synchrotron Radiation Lightsource, SLAC National Accelerator Laboratory, Menlo Park, CA 94025, USA.
Hahn C; SUNCAT Center for Interface Science and Catalysis, SLAC National Accelerator Laboratory, Menlo Park, CA 94025, USA.
Mehta A; Stanford Synchrotron Radiation Lightsource, SLAC National Accelerator Laboratory, Menlo Park, CA 94025, USA.
Jaramillo TF; SUNCAT Center for Interface Science and Catalysis, SLAC National Accelerator Laboratory, Menlo Park, CA 94025, USA.

J Synchrotron Radiat ; 28(Pt 3): 919-923, 2021 May 01.

Article em En | MEDLINE | ID: mdl-33949999

Palavras-chave

electrochemistry; grazing incidence X-ray diffraction; in situ characterization; liquidsolid interfaces; palladium

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Tipo de estudo: Incidence_studies / Risk_factors_studies Idioma: En Ano de publicação: 2021 Tipo de documento: Article

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