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Spinodal Decomposition-Driven Endurable Resistive Switching in Perovskite Oxides.
Liu, Nan; Cao, Yi; Zhu, Yin-Lian; Wang, Yu-Jia; Tang, Yun-Long; Wu, Bo; Zou, Min-Jie; Feng, Yan-Peng; Ma, Xiu-Liang.
Afiliação
  • Liu N; Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, China.
  • Cao Y; School of Material Science and Engineering, University of Science and Technology of China, Hefei 230026, China.
  • Zhu YL; Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, China.
  • Wang YJ; School of Material Science and Engineering, University of Science and Technology of China, Hefei 230026, China.
  • Tang YL; Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, China.
  • Wu B; Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, China.
  • Zou MJ; Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, China.
  • Feng YP; Songshan Lake Materials Laboratory, Dongguan, Guangdong 523808, China.
  • Ma XL; Songshan Lake Materials Laboratory, Dongguan, Guangdong 523808, China.
ACS Appl Mater Interfaces ; 13(26): 31001-31009, 2021 Jul 07.
Article em En | MEDLINE | ID: mdl-34156226
Common pursuits of developing nanometric logic and neuromorphic applications have motivated intensive research studies into low-dimensional resistive random-access memory (RRAM) materials. However, fabricating resistive switching medium with inherent stability and homogeneity still remains a bottleneck. Herein, we report a self-assembled uniform biphasic system, comprising low-resistance 3 nm-wide (Bi0.4,La0.6)FeO3-δ nanosheets coherently embedded in a high-resistance (Bi0.2,La0.8)FeO3-δ matrix, which were spinodally decomposed from an overall stoichiometry of the (Bi0.24,La0.76)FeO3-δ parent phase, as a promising nanocomposite to be a stable and endurable RRAM medium. The Bi-rich nanosheets accommodating high concentration of oxygen vacancies as corroborated by X-ray photoelectron spectroscopy and electron energy loss spectroscopy function as fast carrier channels, thus enabling an intrinsic electroforming-free character. Surficial electrical state and resistive switching properties are investigated using multimodal scanning probe microscopy techniques and macroscopic I-V measurements, showing high on/off ratio (∼103) and good endurance (up to 1.6 × 104 cycles). The established spinodal decomposition-driven phase-coexistence BLFO system demonstrates the merits of stability, uniformity, and endurability, which is promising for further application in RRAM devices.
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2021 Tipo de documento: Article

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2021 Tipo de documento: Article