Low-Power Scan Correlation-Aware Scan Cluster Reordering for Wireless Sensor Networks.

Lee, Sangjun; Cho, Kyunghwan; Kim, Jihye; Park, Jongho; Lee, Inhwan; Kang, Sungho

Lee, Sangjun; Cho, Kyunghwan; Kim, Jihye; Park, Jongho; Lee, Inhwan; Kang, Sungho.

Afiliação

Lee S; Electrical and Electronic Engineering Department, Yonsei University, Seoul 03722, Korea.
Cho K; Electrical and Electronic Engineering Department, Yonsei University, Seoul 03722, Korea.
Kim J; Electrical and Electronic Engineering Department, Yonsei University, Seoul 03722, Korea.
Park J; Electrical and Electronic Engineering Department, Yonsei University, Seoul 03722, Korea.
Lee I; Electrical and Electronic Engineering Department, Yonsei University, Seoul 03722, Korea.
Kang S; Electrical and Electronic Engineering Department, Yonsei University, Seoul 03722, Korea.

Sensors (Basel) ; 21(18)2021 Sep 12.

Article em En | MEDLINE | ID: mdl-34577317

Palavras-chave

cryptography; design for testability (DFT); low-power testing; scan chain reordering; wireless sensor networks

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2021 Tipo de documento: Article

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2021 Tipo de documento: Article