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Generation of an iPSC line (SMCPGi001-A) from a patient with Bain type X-linked mental retardation syndrome carrying HNRNPH2 gene mutation.
Ma, Xiuwei; Zhu, Lina; Chen, Wangyang; Sheng, Min; Peng, Fujun; Liang, Ming; Zhao, Yuxiang; Wang, Yongxia; Feng, Zhichun.
Afiliação
  • Ma X; Faculty of Pediatrics, Chinese PLA General Hospital, Beijing, China; BaYi Children's Hospital, Seventh Medical Center of Chinese PLA General Hospital, Beijing, China; National Engineering Laboratory for Birth Defects Prevention and Control of Key Technology, Beijing, China; Beijing Key Laboratory of
  • Zhu L; Faculty of Pediatrics, Chinese PLA General Hospital, Beijing, China; BaYi Children's Hospital, Seventh Medical Center of Chinese PLA General Hospital, Beijing, China; National Engineering Laboratory for Birth Defects Prevention and Control of Key Technology, Beijing, China; Beijing Key Laboratory of
  • Chen W; Kaiumph Medical Diagnostics Co,Ltd, Beijing, China.
  • Sheng M; Kaiumph Medical Diagnostics Co,Ltd, Beijing, China.
  • Peng F; School of Basic Medical Sciences, Weifang Medical University, Weifang, Shandong, China.
  • Liang M; Faculty of Pediatrics, Chinese PLA General Hospital, Beijing, China; BaYi Children's Hospital, Seventh Medical Center of Chinese PLA General Hospital, Beijing, China; National Engineering Laboratory for Birth Defects Prevention and Control of Key Technology, Beijing, China; Beijing Key Laboratory of
  • Zhao Y; Hospital of Jvlu County, Xingtai, Hebei, China.
  • Wang Y; Faculty of Pediatrics, Chinese PLA General Hospital, Beijing, China; BaYi Children's Hospital, Seventh Medical Center of Chinese PLA General Hospital, Beijing, China; National Engineering Laboratory for Birth Defects Prevention and Control of Key Technology, Beijing, China; Beijing Key Laboratory of
  • Feng Z; Faculty of Pediatrics, Chinese PLA General Hospital, Beijing, China; BaYi Children's Hospital, Seventh Medical Center of Chinese PLA General Hospital, Beijing, China; National Engineering Laboratory for Birth Defects Prevention and Control of Key Technology, Beijing, China; Beijing Key Laboratory of
Stem Cell Res ; 57: 102571, 2021 Oct 23.
Article em En | MEDLINE | ID: mdl-34763229
ABSTRACT
Bain type X-linked mental retardation syndrome is an X-linked dominant neurodevelopmental disorder characterized by psychomotor developmental delay and intellectual disability. The rare syndrome is caused by HNRNPH2 gene mutation. In this study, the iPSC cell line (SMCPGi001-A) was acquired by Sendai virus-mediated iPSC reprogramming from the peripheral blood mononuclear cells (PBMCs) obtained from a 1-year-old girl with de novo p.R206W mutation in the HNRNPH2 gene. The identification experiments of stemness and differentiation potential of three germ layers showed that the cell line had pluripotent stem cell characteristics and the potential of tridermal differentiation.
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Tipo de estudo: Prognostic_studies Idioma: En Ano de publicação: 2021 Tipo de documento: Article

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Tipo de estudo: Prognostic_studies Idioma: En Ano de publicação: 2021 Tipo de documento: Article