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Scanning probe analysis of twisted graphene grown on a graphene/silicon carbide template.
Yao, Yao; Negishi, Ryota; Takajo, Daisuke; Takamura, Makoto; Taniyasu, Yoshitaka; Kobayashi, Yoshihiro.
Afiliação
  • Yao Y; Department of Applied Physics, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan.
  • Negishi R; Department of Applied Physics, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan.
  • Takajo D; Research Center for Thermal and Entropic Science, Graduate School of Science, Osaka University, 1-1 Machikaneyama-cho, Toyonaka, Osaka 560-0043, Japan.
  • Takamura M; NTT Basic Research Laboratories, NTT Corporation, 3-1, Morinosato Wakamiya Atsugi, Kanagawa 243-0198, Japan.
  • Taniyasu Y; NTT Basic Research Laboratories, NTT Corporation, 3-1, Morinosato Wakamiya Atsugi, Kanagawa 243-0198, Japan.
  • Kobayashi Y; Department of Applied Physics, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan.
Nanotechnology ; 33(15)2022 Jan 19.
Article em En | MEDLINE | ID: mdl-34969026
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2022 Tipo de documento: Article
Texto completo
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2022 Tipo de documento: Article