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Insulation Performance and Simulation Analysis of SiO2-Aramid Paper under High-Voltage Bushing.
Liu, Bowen; Lv, Fangcheng; Fan, Xiaozhou; Xiao, Hai; Bi, Hanwen.
Afiliação
  • Liu B; Hebei Provincial Key Laboratory of Power Transmission Equipment Security Defence, North China Electric Power University, Baoding 071003, China.
  • Lv F; Hebei Provincial Key Laboratory of Power Transmission Equipment Security Defence, North China Electric Power University, Baoding 071003, China.
  • Fan X; Hebei Provincial Key Laboratory of Power Transmission Equipment Security Defence, North China Electric Power University, Baoding 071003, China.
  • Xiao H; Hebei Provincial Key Laboratory of Power Transmission Equipment Security Defence, North China Electric Power University, Baoding 071003, China.
  • Bi H; Hebei Provincial Key Laboratory of Power Transmission Equipment Security Defence, North China Electric Power University, Baoding 071003, China.
Nanomaterials (Basel) ; 12(5)2022 Feb 23.
Article em En | MEDLINE | ID: mdl-35269236
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Tipo de estudo: Prognostic_studies Idioma: En Ano de publicação: 2022 Tipo de documento: Article
Texto completo
Imprimir
XML
PubMed Links
Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Tipo de estudo: Prognostic_studies Idioma: En Ano de publicação: 2022 Tipo de documento: Article