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Review of Semiconductor Flash Memory Devices for Material and Process Issues.
Kim, Seung Soo; Yong, Soo Kyeom; Kim, Whayoung; Kang, Sukin; Park, Hyeon Woo; Yoon, Kyung Jean; Sheen, Dong Sun; Lee, Seho; Hwang, Cheol Seong.
Afiliação
  • Kim SS; Department of Materials Science and Engineering and Inter-University Semiconductor Research Center, Seoul National University, Seoul, 08826, Republic of Korea.
  • Yong SK; Samsung Electronics, Hwaseong, Gyeonggi-do, 18448, Republic of Korea.
  • Kim W; Department of Materials Science and Engineering and Inter-University Semiconductor Research Center, Seoul National University, Seoul, 08826, Republic of Korea.
  • Kang S; Samsung Electronics, Hwaseong, Gyeonggi-do, 18448, Republic of Korea.
  • Park HW; Department of Materials Science and Engineering and Inter-University Semiconductor Research Center, Seoul National University, Seoul, 08826, Republic of Korea.
  • Yoon KJ; SK Hynix Inc., Icheon, Gyeonggi-do, 17336, Republic of Korea.
  • Sheen DS; Department of Materials Science and Engineering and Inter-University Semiconductor Research Center, Seoul National University, Seoul, 08826, Republic of Korea.
  • Lee S; Department of Materials Science and Engineering and Inter-University Semiconductor Research Center, Seoul National University, Seoul, 08826, Republic of Korea.
  • Hwang CS; Data Platforms Group, Intel, Santa Clara, CA, 95054, USA.
Adv Mater ; 35(43): e2200659, 2023 Oct.
Article em En | MEDLINE | ID: mdl-35305277
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2023 Tipo de documento: Article
Texto completo
Imprimir
XML
PubMed Links
Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Ano de publicação: 2023 Tipo de documento: Article